Defect Inspection System for Wafers
VTT seeks an automated defect inspection tool for 200/300 mm wafers to rapidly track manufacturing defects and ensure the quality of functional devices.
CONTRACTING AUTHORITY
Name
VTT Technical Research Centre of Finland Ltd
Country
FI
CLASSIFICATION
Procedure Type
Open Procedure
Contract Type
Supplies
Main CPV
38000000, Laboratory, optical and precision equipments (excl. glasses).
ADDITIONAL DETAILS
Suitable for SMEs
Yes
Electronic Submission
Required
Legal Basis
32014L0024
DEADLINES & TIMELINE
Submission Deadline
39 days remaining(LOT-0000)
Published