Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for Lund University
Procurement of a state-of-the-art Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for research purposes at Lund University. This instrument will enable advanced analysis and characterization of materials at the highest level.
CONTRACTING AUTHORITY
Name
Lunds universitet
City
Lund
Country
SE
CLASSIFICATION
Procedure Type
Open Procedure
Contract Type
Supplies
Main CPV
38511100, Scanning electron microscopes.
Other CPV
38000000, Laboratory, optical and precision equipments (excl. glasses).
ADDITIONAL DETAILS
EU Funded
Yes
Electronic Submission
Required
Legal Basis
32014L0024
DEADLINES & TIMELINE
Submission Deadline
54 days remaining(LOT-0001)
Published