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Activeted-252965-2026

X-Ray Diffraction System for 6-inch Wafers

Procurement and installation of an X-ray diffraction system designed for 6-inch wafers, featuring automated wafer loading and cassette-to-cassette handling.

CONTRACTING AUTHORITY

Name

Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO

City

Den Haag

Country

NL

CLASSIFICATION

Procedure Type

Open Procedure

Contract Type

Supplies

Main CPV

38400000 – Instruments for checking physical characteristics.

Other CPV

38000000Laboratory, optical and precision equipments (excl. glasses).

ADDITIONAL DETAILS

EU Funded

Yes

Electronic Submission

Required

Legal Basis

32014L0024

DEADLINES & TIMELINE

Submission Deadline

13 days remaining

(LOT-0000)

Published

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