X-Ray Diffraction System for 6-inch Wafers
Procurement and installation of an X-ray diffraction system designed for 6-inch wafers, featuring automated wafer loading and cassette-to-cassette handling.
CONTRACTING AUTHORITY
Name
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
City
Den Haag
Country
NL
CLASSIFICATION
Procedure Type
Open Procedure
Contract Type
Supplies
Main CPV
38400000 – Instruments for checking physical characteristics.
Other CPV
38000000 – Laboratory, optical and precision equipments (excl. glasses).
ADDITIONAL DETAILS
EU Funded
Yes
Electronic Submission
Required
Legal Basis
32014L0024
DEADLINES & TIMELINE
Submission Deadline
13 days remaining(LOT-0000)
Published