Electrochemical atomic force microscopy device

Notice title: Electrochemical atomic force microscopy device

Delivery of an electrochemical atomic force microscopy device: non-resonant sinusoidal-oscillating imaging mode (nroIM) with pure vertical z-modulation of the cantilever (amplitudes from 250 nm, frequencies from 125 Hz up to 2 kHz freely selectable); real-time determination of maximum contact force (force setpoint) with minimum down to 10 pN; effective line rate >= 2 Hz at 512 pixel/line; suitable for cantilevers with spring constants from 500 N/m; simultaneous measurement and display of topography, DMT modulus, adhesion, energy dissipation, force setpoint error, and deformation; lateral resolution down to atomic defects; continuous display of tip-sample force interaction; operation with liquid cells, heating cells, EC cells without functional limitation, automatic elimination of cantilever drift. The system is temperature-controlled to minimize thermal drift, with sensor in scanner and bridge and feedback loop for similar temperatures; heating capability from ambient to 35 deg. C. The atomic force microscope (AFM) features low-z-noise (= 85 µm x 85 µm x 9.5 µm XYZ; a large sample space for integrating heavy (> 5 kg) additional components; a motorized 150 mm x 150 mm sample stage; extensive resonant, non-resonant, and non-resonant oscillating imaging modes, including nroIM with automated, continuous contact force dependent imaging gains optimization; enhanced scan parameter optimization algorithms for continuous monitoring and automatic optimization of key feedback-loop parameters (gains, setpoint) for all 3 imaging modes (contact, resonant, and non-resonant oscillating), based on a trace-retrace correlation score; extensive piezo force microscopy (PFM) imaging and spectroscopy modes (volume spectroscopy, hyperspectral mapping modes of PFM signals, frequency sweep, contact resonance frequency, and eigenmode (amplitude/phase versus voltage) simultaneously to topography and mechanical properties, referred to as dataCUBE modes); torsional resonance mode for acquiring dynamic friction signals and high-resolution imaging of moire patterns of stacked 2D materials; nano-electrical imaging of surface potential (KPFM) in non-resonant, sinusoidal-oscillating imaging mode. Sample handling and automation include an accessible sample space >= 150 mm x 150 mm x 18 mm XYZ, up to 45 mm height; a motorized (minimum 150 mm x 150 mm) and programmable sample stage with vacuum sample hold down; vertical, software-controlled, and automated AFM-tip engage functionality.

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