FIB-SEM System with Analytical Techniques and Nanoindentation
Status
Active
Submission Deadline
34 days remaining
Contracting authority
Univerzita Palackého v Olomouci7 more open tenders view
Location
Olomouc, Czechia
Estimated Value
CZK 31,452,000
Procedure
Open Procedure · Supplies
Category
Scanning electron microscopes.Ion microscopes.Spectrometers.
Published
Reference
ted-572059-2026
Source
Delivery of a FIB-SEM microscope (scanning electron microscope with ion beam) with the capability for deposition of at least three materials (platinum, carbon, tungsten) and with analytical techniques for material analysis: 4DSTEM, EBSD, EDS, Nanoindentation, TOF-SIMS.
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Tender documents
- Portal — LOT-0001NON-RESTRICTED-DOCUMENT
- TED HTML — 572059-2026HTML
- TED PDF — 572059-2026PDF
- TED XML — 572059-2026XML
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Additional details
EU Funded
Yes
Suitable for SMEs
Yes
Electronic Submission
Required
Legal Basis
32014L0024