FIB-SEM System with Analytical Techniques and Nanoindentation
Status
Active
Submission Deadline
18 days remaining
Contracting authority
Univerzita Palackého v Olomouci6 more open tenders view
Location
Olomouc, Czechia
Estimated Value
CZK 31,452,000
Procedure
Open Procedure · Supplies
Category
Scanning electron microscopes.Ion microscopes.Spectrometers.
Published
Reference
ted-513059-2026
Source
Delivery of a microscopic FIB-SEM system (scanning electron microscope with ion beam) with the capability for deposition of at least three materials (platinum, carbon, tungsten) and with subsequent analytical techniques for detailed material analysis (4DSTEM, EBSD, EDS, Nanoindentation, TOF-SIMS). Minimum requirements are defined in the technical, commercial, and other contractual conditions of the tender documents, specifically the technical specification and the binding contract draft.
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Tender documents
- Portal — LOT-0001NON-RESTRICTED-DOCUMENT
- TED HTML — 513059-2026HTML
- TED PDF — 513059-2026PDF
- TED XML — 513059-2026XML
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Additional details
EU Funded
Yes
Suitable for SMEs
Yes
Electronic Submission
Required
Legal Basis
32014L0024