Optical Inspection System for 100, 150, and 200mm Wafers
Procurement of an optical inspection system for CEA LETI's research and development activities, capable of inspecting wafers of 100mm, 150mm, and 200mm diameters with advanced sensitivity.
CONTRACTING AUTHORITY
Name
CEA Grenoble
City
Grenoble
Country
FR
CLASSIFICATION
Procedure Type
neg-w-call
Contract Type
Supplies
Main CPV
31712100, Microelectronic machinery and apparatus.
ADDITIONAL DETAILS
EU Funded
Yes
Electronic Submission
Required
Legal Basis
32014L0024
DEADLINES & TIMELINE
Submission Deadline
27 days remaining(LOT-0001)
Published