Photoluminescence Mapper NIR
Photoluminescence Mapper NIR: Measurements in the spectral range of 800-2150 nm for the characterization of (AlInGa)(AsP)-heterostructures; mapping of entire 2-6 inch (50 mm - 150 mm) wafers. Options: automated excitation density tuning for Laser 1, Laser 2 (DPSS) for InGaAs-contact bleach out for layers with thicknesses of 50-200 nm, flexible sample holder with vacuum clamping on the entire chuck, mount for DataRay BladeCam2.
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