TEM Measurements for Sensor Components and Transistors
Fraunhofer ENAS is seeking high-resolution TEM cross-section analyses of sensor components and field-effect transistors to examine interfaces.
CONTRACTING AUTHORITY
Name
Fraunhofer ENAS
City
Chemnitz
Country
DE
CLASSIFICATION
Procedure Type
de-open
ADDITIONAL DETAILS
Legal Basis
32014L0024
DEADLINES & TIMELINE
Submission Deadline
10 days remaining(LOT-0000)
Published