Activeted-382478-2026
Wafer-Capable PFIB-SEM System
Procurement of a state-of-the-art Plasma Focused Ion Beam Scanning Electron Microscope system, suitable for wafer applications. This system will advance research and development at Imec EU Pilot line NV.
CONTRACTING AUTHORITY
Name
Imec EU Pilot line NV
City
Heverlee
Country
BE
CLASSIFICATION
Procedure Type
neg-w-call
Contract Type
Supplies
Main CPV
38000000, Laboratory, optical and precision equipments (excl. glasses).
ADDITIONAL DETAILS
EU Funded
Yes
Electronic Submission
Required
Legal Basis
32014L0024
DEADLINES & TIMELINE
Submission Deadline
30 days remaining(LOT-0001)
Published