Activeted-413311-2026
300 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz
Procurement of a semi-automatic 300 mm RF probe system with controlled dry atmosphere for precise on-wafer measurements. The system prevents condensation and ice formation and supports automatic wafer size detection.
CONTRACTING AUTHORITY
Name
IHP GmbH - Leibniz-Institut für innovative Mikroelektronik
City
Frankfurt (Oder)
Country
DE
CLASSIFICATION
Procedure Type
Open Procedure
Contract Type
Supplies
Main CPV
38341300, Instruments for measuring electrical quantities.
Other CPV
38540000, Machines and apparatus for testing and measuring.
ADDITIONAL DETAILS
EU Funded
Yes
Suitable for SMEs
Yes
Electronic Submission
Required
Legal Basis
32014L0024
DEADLINES & TIMELINE
Submission Deadline
28 days remaining(LOT-0001)
Published