Activeted-435079-2026
FIB-SEM Dualbeam System for Semiconductor Analysis
Procurement of a high-resolution FIB-SEM dual-beam system for structuring and analysis of semiconductors, LNOI, and polymers. The system enables automated routines and is designed for semiconductor technology.
CONTRACTING AUTHORITY
Name
Fraunhofer-Gesellschaft - Einkauf B12
City
München
Country
DE
CLASSIFICATION
Procedure Type
neg-w-call
Contract Type
Supplies
Main CPV
42900000, Miscellaneous general and special-purpose machinery.
Other CPV
38512100, Ion microscopes.
ADDITIONAL DETAILS
EU Funded
Yes
Suitable for SMEs
Yes
Electronic Submission
allowed
Legal Basis
32014L0024
DEADLINES & TIMELINE
Submission Deadline
28 days remaining(LOT-0000)
Published