Supply of a scanning electron microscope and analytical detectors

Supply of a scanning electron microscope and analytical detectors for CEA LITEN. Mandatory options include: software for automatic image acquisition, a second EDX detector, mosaic and stitching capabilities for the EDX software, a deceleration system for the sample stage, and a low-voltage backscatter electron detector. Optional options are: a one-year warranty extension, and transport costs including insurance according to DAP CEA Grenoble (Incoterms ICC 2020).

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