Secondary ion mass spectrometer (SIMS)
Status
Active
Submission Deadline
28 days remaining
Contracting authority
Fraunhofer-Gesellschaft, Einkauf B1216 more open tenders view
Location
München, Germany
Procedure
Open Procedure · Supplies
Category
Miscellaneous special-purpose machinery.
Published
Reference
ted-583241-2026
Source
Secondary ion mass spectrometer (SIMS): 1 pc. Highly sensitive instrument for depth-profiled chemical analysis of semiconductor materials and structures, offering high depth resolution and high mass resolving power. Enables precise dopant and impurity profiling, as well as accurate determination of layer thickness and homogeneity, for characterizing advanced III-V and diamond-based device structures and epitaxial layers, including 150 mm substrates, for Fraunhofer IAF.
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Additional details
EU Funded
Yes
Suitable for SMEs
No
Electronic Submission
Allowed
Legal Basis
32014L0024