SOC Test System for Fraunhofer EMFT
Delivery of a semiconductor test system (mixed-signal test system) for post-silicon verification, characterization, and functional testing of integrated circuits and chiplets at Fraunhofer EMFT: The test system must provide interfaces for connection to an industrial standard wafer probing system and an industrial standard device handling system, and be hardware and software compatible with an existing Advantest V93000 test system within the Fraunhofer-Gesellschaft.
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