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Picosecond Ultrasonics Film Thickness Measurement Tool

We are seeking a fully automated cassette-to-cassette measurement system using picosecond ultrasonics for materials characterization in semiconductor processes.

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CONTRACTING AUTHORITY

Name

TEKNOLOGIAN TUTKIMUSKESKUS VTT OY

Country

FI

CLASSIFICATION

Procedure Type

neg-wo-call

Contract Type

Supplies

Main CPV

38300000 – Measuring instruments.

ADDITIONAL DETAILS

Electronic Submission

Required

Legal Basis

32014L0024

DEADLINES & TIMELINE

Submission Deadline

167 days remaining

(LOT-0000)

Published

167 days remaining

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